Cost/Quality Trade-off in Synthesis for BIST

This paper details our allocation for Built-in Self Test (BIST) technique used in the Interactive Design for Test reuse in Allocation for Testability (IDAT) tool. IDAT tool objective is to fullll the designer requirements regarding selected design and testability attributes of a circuit data-path to be synthesized. A related tool is used to synthesize a test controller for the nal testable circuit. The allocation process of BIST resources in the datapath is driven by two trade-oo techniques performed in order to: (1) at the local level, select the optimal set of Functional Units (FUs) to be BISTed, using a new testability analysis method and (2) at the global level, for each selected FU of this set, choose either to allocate its BIST version (when available in a library) or to connect it to an internal Test Pattern Generator (TPG) and Test Results Checker (TRC). When necessary, a last step of the process is the allocation of scan chains used to test the remaining untested interconnections. Experiments show the results of our allocation for BIST technique on two benchmarks.